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Hitachi S-2460N Scanning Electron Microscope
Hitachi S-2460N Scanning Electron Microscope Conventional high
vacuum plus "Variable Pressure" scanning electron microscopy
in low vacuum conditions with or without speciman preperation.
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Specifications
- Resolution (high vacuum mode): 4 nm
- Resolution (low vacuum mode): 6 nm
- Magnification: x20 ~ 200,000 (41 steps)
- Accelerating voltage: 0.5 ~ 25 kV (39 steps)
- Sample size: 150 mm in diameter (max)
- EDS detector for X-ray microanalysis
- Mode selector: Automatic (Menu Control)
- SE/BSE detector selection: Automatic (Menu Control) Operating
vacuum in V.P. mode: 1.0 ~ 270 Pa (0.01 ~ 2 Torr) in sample
chamber
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