Authors: Birnie, D.P. III; Weinberg, J.D.; Swanson, D.G.
Source: Journal of Materials Research 7 (1992) 741-744

Abstract: Several copper vanadium oxide melts were tested for possible application as the active medium in phase-change optical data storage devices. These materials were melted in the bulk and then quenched. Their phase development was characterized to help determine their applicability to optical data storage. It was found that they satisfy many of the criteria necessary for successful phase-change data storage; further studies of their behavior in thin film geometry would be warranted.