MSE 480/580-Experimental Methods for Microstructural Analysis
Spring Semester
2000-01 Catalog Data:MSE 480 Experimental Methods for Microstructural Analysis (3) II An introduction, through a combination
of lectures and laboratory experiences, to both established and new techniques for microstructural characterization
of materials. 3ES. May be convened with MSE 580.
John P. Sibilia, A Guide to Materials Characterization and Chemical Analysis,
VCH Publishers, Inc. 1988.
D.K. Schroder, Semiconductor Materials and Device Characterization, John Wiley & Sons,
1990.
B.D. Cullity, Elements of X-ray Diffraction, Addison-Wesley Publishing Company, Inc., 1978.
J.I. Goldstein, D.E. Newberry, P. Echlin, C. D. Joy, C. Fiori and E. Lifshin, Scanning
Electron Microscopy and X-ray Microanalysis, Plenum Press, NY, 1981.
W.-K. Chu, J. W. Mayer and M.-A. Nicolet, Backscattering Spectrometry, Academic Press
1978.
J.F. Watts, An introduction to Serface Analysis by Electron Spectroscopy, Oxford University
Press, 1990.
Instructor:
Supapan Seraphin, Associate Professor of Materials Science and Engineering
Prerequisites by Topic:
Basic knowledge of physics and chemistry
Advanced knowledge of materials science
Goals:
This course is designed to familiarize junior/senior-level students with the wide range
of experimental techniques used in microstructural characterization of materials. Students gain
an understanding of the fundamental principles behind modern characterization techniques, as well
as an appreciation of the practical limitations associated with each technique. The class
emphasizes cooperative learning and team work (40% of the grade). Students must communicate
effectively during the goup activities and individual presentations to the class.
Course Topics (Class Hours):
Introduction (4)
-- Material problems and analytical techniques
-- Spatial resolution and detection limits
-- Concepts defining degree of vacuum
Optical Techniques (4)
-- Raman spectroscopy
-- FTIR spectroscopy
X-Ray Analysis (12)
-- X-Ray production/absorption edge
-- Bragg diffraction
-- Single crystal techniques
-- Powder techniques
-- Fluorescence
Electron Beam Analysis (12)
-- Electron guns, lenses, etc.
-- Beam-specimen interactions
-- TEM/SAD
-- SEM/image processing
-- Electron microprobe
Electron Spectroscopy (8)
-- XPS/ion sputtering
-- Auger/scanning auger
Ion Beam Techniques (8)
-- Rutherford backscattering spectroscopoy
-- Secondary ion mass spectroscopy
Class Requirements:
Two lecture sessions and a 3-hour laboratory session per week.
Ten-minute quizzes every two weeks.
A group presentation.
A mid-term examination and a final examination.
*Note: Graduate-Level: Requirements include an additional term paper
Computer Usage:
Students are required to do interactive exercises developed under the supervision of the
instructor at the Computer Network Laboratory for Microscopy Education, a Sun Workstation Laboratory
supported by NSF, ILI program.
All of the characterization techniques covered in class are compiled in the computers. Students
are required to prepare their laboratory reports and their oral presentations using word
processors and software packages.
Laboratory Projects:
In laboratory sessions, students will be involved in the characterization of samples using
the following techniques: FTIR, Raman Microprobe, powder x-ray diffraction, x-ray fluorescence,
SEM, AES, XPS, TEM and RBS.
